PXRD vs. XRF + LOI
Dear X-ray colleagues,
I quantify the mineral content of geological samples with Rietveld using the program TOPAS (and rarely BGMN). I cross-check the results with XRF data which works quite well ... except for (soil) samples that have a very high loss on ignition (LOI; determinded at 1050 °C). An LOI higher than approx. 4 wt% results in an overestimation of quartz (?) with Rietveld thus leading to an erroneous SiO2 content.
To put it in other words: The mineral content recaluclated to major element oxides results in too high an SiO2-content. When comparing with XRF analyses, this SiO2 excess exactly corresponds to the LOI. Example: LOI = 5 wt%, SiO2 (XRF) = 50 wt%, SiO2 (Rietveld-recalculated) = 55 wt%
Has anyone ever come across this problem, too? If the LOI "only" represents the (structurally-bound) H2O-content and some organic compounds, why does it affect the SiO2 content?
I'd be grateful for any small hint!
Best wishes, Jasmin
I quantify the mineral content of geological samples with Rietveld using the program TOPAS (and rarely BGMN). I cross-check the results with XRF data which works quite well ... except for (soil) samples that have a very high loss on ignition (LOI; determinded at 1050 °C). An LOI higher than approx. 4 wt% results in an overestimation of quartz (?) with Rietveld thus leading to an erroneous SiO2 content.
To put it in other words: The mineral content recaluclated to major element oxides results in too high an SiO2-content. When comparing with XRF analyses, this SiO2 excess exactly corresponds to the LOI. Example: LOI = 5 wt%, SiO2 (XRF) = 50 wt%, SiO2 (Rietveld-recalculated) = 55 wt%
Has anyone ever come across this problem, too? If the LOI "only" represents the (structurally-bound) H2O-content and some organic compounds, why does it affect the SiO2 content?
I'd be grateful for any small hint!
Best wishes, Jasmin